Group for atomic force microscopy and optical spectroscopy

 

group leaders: Dana Vasilјević Radović and Danijela Ranđelović

The group deals with characterization of nanomaterials and structures, MEMS and NEMS devices and systems. The methods of scanning probe micrscopy are used (atomic force microscopy, AFM), ultraviouled, visible and infrared spectrscopy, as well as infrared microscopy.

Topics
Atomic force microscopy
Nano
fabrication by scanning probe (nanoscratching)
UV,
visible and IR spectroscopy
I
R microscopy
H
all measurements